Recent developments have opened up a whole new range of applications and possibilities for micro-XRF element mapping.
You can now analyse:
The workshop will explain these technological developments and the new possibilities. This will be followed by live demonstrations on the Bruker M4 TORNADO bring your own samples to analyse, see the results and have your questions answered.
All are welcome; register online using the book now button.
You can now analyse:
- Light elements down to carbon
- Samples with topography
- Vacuum-sensitive materials with a He-purge system
- Higher throughput than ever before
The workshop will explain these technological developments and the new possibilities. This will be followed by live demonstrations on the Bruker M4 TORNADO bring your own samples to analyse, see the results and have your questions answered.
Programme
- New Applications with Enhanced Micro-XRF A non-destructive method for elemental mapping from C to Am, Andreas Wittkopp, Bruker
- Invited Speakers TBC
- Hands-on Practical Session, Faulk Reinhardt, Bruker
- Lunch
- Practical Session Analysing your samples
Registration
There is no charge to attend but advance registration is required. Lunch and refreshments will be provided.All are welcome; register online using the book now button.